Navid Asadi is an Associate Professor in the Electrical and Computer Engineering Department at the University of Florida with an affiliation to the Materials Science and Engineering department. He investigates novel techniques for IC counterfeit detection and prevention, system and chip level decomposition and security assessment, anti-reverse engineering, 3D imaging, invasive and semi-invasive physical assurance, supply chain security, etc. Dr. Asadi is director of the Security and Assurance (SCAN) lab house to more than $10M advanced imaging and characterization equipment. He also serves as the associate director of the Microelectronics Security Training (MEST) center which is a multi-million dollar program to train and reskill the professional engineers in the area of security. Dr. Asadi has received his NSF CAREER award in 2022 and several best paper awards from IEEE International Symposium on Hardware Oriented Security and Trust (HOST) and the ASME International Symposium on Flexible Automation (ISFA). He was also winner of D.E. Crow Innovation award from University of Connecticut. He is also founder and the general chair of the IEEE Physical Assurance and Inspection of Electronics (PAINE) Conference. His projects are sponsored by various government agencies and industry including but not limited to NSF, AFRL, AFOSR, ONR, SRC, Meta, Cisco, Analog Devices, etc.