Navid Asadi is an Associate Professor in the Electrical and Computer Engineering Department at the University of Florida, with an affiliation with the Materials Science and Engineering department. He investigates novel techniques for electronics inspection, metrology, failure analysis, and assurance, system- and chip-level decomposition, anti-reverse engineering, 3D imaging, invasive and semi-invasive methods, and supply chain security. Dr. Asadi is the director of the Security and Assurance (SCAN) lab, which houses more than $15M in advanced imaging and characterization equipment. He also serves as the associate director of the Florida Semiconductor Institute (FSI).
Dr. Asadi received the NSF CAREER award in 2022 and has received several best paper awards from IEEE ECTC, SMTA International, and the ASME International Symposium on Flexible Automation (ISFA). He was also the winner of the D.E. Crow Innovation Award from the University of Connecticut. He is the founder and general chair of the IEEE Physical Assurance and Inspection of Electronics (PAINE) Conference. His projects are sponsored by various government agencies and industry partners, including NSF, AFRL, AFOSR, ONR, SRC, Meta, Cisco, and Analog Devices.