{"id":2139,"date":"2026-03-10T13:18:56","date_gmt":"2026-03-10T18:18:56","guid":{"rendered":"https:\/\/faculty.eng.ufl.edu\/quanta\/?page_id=2139"},"modified":"2026-03-20T15:33:52","modified_gmt":"2026-03-20T20:33:52","slug":"radiation-research","status":"publish","type":"page","link":"https:\/\/faculty.eng.ufl.edu\/quanta\/research\/radiation-research\/","title":{"rendered":"Radiation Research"},"content":{"rendered":"\n<div style=\"height:50px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<div class=\"wp-block-group has-blue-background-color has-background\"><div class=\"wp-block-group__inner-container is-layout-constrained wp-block-group-is-layout-constrained\">\n<p class=\"has-text-align-center has-x-large-font-size\"><strong>Overview<\/strong><\/p>\n\n\n\n<hr class=\"wp-block-separator has-text-color has-white-color has-alpha-channel-opacity has-white-background-color has-background is-style-wide\" \/>\n\n\n\n<p>Our lab has significantly advanced the understanding of radiation-material interactions in MEMS and NEMS. The lab has examined how gamma rays, protons, heavy ions, and ion-induced displacement damage&nbsp;affects&nbsp;the structural integrity and resonant performance of advanced materials and devices. Ion induced displacement damage and&nbsp;heavy ion&nbsp;irradiation have the potential to influence MEMS resonators\u2019 frequency stability, quality factor, and defect formation. Specifically, the lab&nbsp;demonstrated&nbsp;how gamma&nbsp;rays&nbsp;influences resonators of several materials: molybdenum disulfide (MoS2), gallium nitride (GaN), aluminum nitride (AlN), and silicon carbide (SiC) nano mechanical resonators are among the list of materials tested.\u202f&nbsp;<\/p>\n<\/div><\/div>\n\n\n\n<div style=\"height:100px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Featured Publications:<\/h3>\n\n\n\n<div style=\"height:50px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-9d6595d7 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column lab-news-item is-layout-flow wp-block-column-is-layout-flow\"><div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"602\" height=\"390\" src=\"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/SEM-Resonantor-Pic.png\" alt=\"\" class=\"wp-image-2775\" style=\"width:auto;height:300px\" srcset=\"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/SEM-Resonantor-Pic.png 602w, https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/SEM-Resonantor-Pic-300x194.png 300w\" sizes=\"auto, (max-width: 602px) 100vw, 602px\" \/><\/figure>\n<\/div>\n\n\n<p class=\"has-text-align-center\"><strong><span style=\"text-decoration: underline\"><a href=\"https:\/\/doi.org\/10.1088\/1361-6641\/32\/1\/013005\">The Study of Radiation Effects in Emerging Micro and Nanoelectromechanical Systems (MEMS and NEMS)<\/a><\/span><\/strong><\/p>\n\n\n\n<p style=\"text-align: justify\"><span class=\"TextRun SCXW87448247 BCX0\" lang=\"EN-IN\" xml:lang=\"EN-IN\" data-contrast=\"auto\"><span class=\"NormalTextRun SCXW87448247 BCX0\">Our lab collaborated on this comprehensive review paper surveying radiation effects across a wide variety of emerging MEMS and NEMS devices and materials. We contributed to covering how different radiation types (gamma, proton, heavy ion, neutron) affect device properties such as resonant frequency, quality factor, and structural integrity across materials including&nbsp;<\/span><span class=\"NormalTextRun SpellingErrorV2Themed SCXW87448247 BCX0\">SiC<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">,&nbsp;<\/span><span class=\"NormalTextRun SpellingErrorV2Themed SCXW87448247 BCX0\">GaN<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">, graphene, MoS\u2082, and&nbsp;<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">piezoelectric<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">. Together with our collaborators, we&nbsp;<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">identified<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">&nbsp;key open research questions and positioned M\/<\/span><span class=\"NormalTextRun ContextualSpellingAndGrammarErrorV2Themed SCXW87448247 BCX0\">NEMS<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">&nbsp;radiation hardness as a critical concern for deployment in space, nuclear, and&nbsp;<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">defence<\/span><span class=\"NormalTextRun SCXW87448247 BCX0\">&nbsp;environments.<\/span><\/span><span class=\"TextRun SCXW87448247 BCX0\" lang=\"EN-US\" xml:lang=\"EN-US\" data-contrast=\"auto\"><span class=\"NormalTextRun SCXW87448247 BCX0\">&nbsp;<\/span><\/span><span class=\"EOP Selected SCXW87448247 BCX0\" data-ccp-props=\"{}\">&nbsp;<\/span><\/p>\n<\/div>\n\n\n\n<div class=\"wp-block-column lab-news-item is-layout-flow wp-block-column-is-layout-flow\"><div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"828\" height=\"664\" src=\"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/Screenshot-2026-03-10-at-12.01.41-PM-1.png\" alt=\"\" class=\"wp-image-2143\" style=\"width:auto;height:300px\" srcset=\"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/Screenshot-2026-03-10-at-12.01.41-PM-1.png 828w, https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/Screenshot-2026-03-10-at-12.01.41-PM-1-300x241.png 300w, https:\/\/faculty.eng.ufl.edu\/quanta\/wp-content\/uploads\/sites\/679\/2026\/03\/Screenshot-2026-03-10-at-12.01.41-PM-1-768x616.png 768w\" sizes=\"auto, (max-width: 828px) 100vw, 828px\" \/><\/figure>\n<\/div>\n\n\n<p class=\"has-text-align-center\"><strong><span style=\"text-decoration: underline\"><a href=\"https:\/\/doi.org\/10.1109\/TNS.2022.3233525\">In-Situ&nbsp;Measurement of 1.8MeV Proton Radiation Effects on Comb-Drive MEMS Resonators<\/a><\/span><\/strong><\/p>\n\n\n\n<p style=\"text-align: justify\"><span class=\"TextRun SCXW262551404 BCX0\" lang=\"EN-IN\" xml:lang=\"EN-IN\" data-contrast=\"auto\"><span class=\"NormalTextRun SCXW262551404 BCX0\">Our lab performed real-time, in situ measurements of 1.8-MeV proton irradiation effects on silicon comb-drive MEMS resonators, capturing how resonant frequency and other parameters evolve\u00a0<\/span><\/span><span class=\"TextRun SCXW262551404 BCX0\" lang=\"EN-IN\" xml:lang=\"EN-IN\" data-contrast=\"auto\"><span class=\"NormalTextRun SCXW262551404 BCX0\">during<\/span><\/span><span class=\"TextRun SCXW262551404 BCX0\" lang=\"EN-IN\" xml:lang=\"EN-IN\" data-contrast=\"auto\"><span class=\"NormalTextRun SCXW262551404 BCX0\">\u00a0live irradiation rather than only before and after. This in situ approach allowed us to distinguish transient effects from permanent displacement damage, providing a more complete picture of how proton radiation degrades resonator performance. Our results have direct implications for understanding MEMS reliability in proton-rich space radiation environments and for developing testing methodologies for radiation qualification.<\/span><\/span><span class=\"EOP Selected SCXW262551404 BCX0\" data-ccp-props=\"{}\">\u00a0<\/span><\/p>\n<\/div>\n<\/div>\n\n\n\n<h3 class=\"wp-block-heading\">References:<\/h3>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Arutt&nbsp;CN, Alles ML<sup>*<\/sup>, Liao W, Gong H, Davidson JL, Schrimpf RD, Reed RA, Weller RA, Bolotin K, Nicholl R, Pham TT, Zettl A, Du Q, Hu JJ, Li M,&nbsp;Alphenaar&nbsp;BW, Lin J-T,&nbsp;Shurva&nbsp;PD, McNamara S, Walsh KM,&nbsp;<strong>Feng PXL<\/strong>,&nbsp;Hutin&nbsp;L, Ernst T,&nbsp;Homeijer&nbsp;BD,&nbsp;Polcawich&nbsp;RG,&nbsp;Proie&nbsp;RM, Jones JL, Glaser ER, Cress CD, Bassiri-Gharb N, \u201cThe Study of Radiation Effects in Emerging Micro and Nanoelectromechanical Systems (MEMS and NEMS)\u201d,&nbsp;<em>Semiconductor Science &amp; Technology<\/em>&nbsp;<strong>32<\/strong>, 013005 (2017). DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1088\/1361-6641\/32\/1\/013005\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1088\/1361-6641\/32\/1\/013005<\/a>\u202f&nbsp;&nbsp;&nbsp;<\/li>\n\n\n\n<li>Lee J, McCurdy MW, Reed RA, Schrimpf RD, Alles ML,&nbsp;<strong>Feng PXL<\/strong><sup>*<\/sup>, \u201c<em>In-Situ<\/em>&nbsp;Measurement of 1.8MeV Proton Radiation Effects on Comb-Drive MEMS Resonators\u201d,&nbsp;<em>IEEE Transactions on Nuclear Science<\/em>&nbsp;<strong>70<\/strong>(4), 462-468 (2023). DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1109\/TNS.2022.3233525\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1109\/TNS.2022.3233525<\/a>\u202f&nbsp;<\/li>\n\n\n\n<li>Chen H,&nbsp;Jia H, Liao W,&nbsp;Pashaei V,&nbsp;Arutt&nbsp;CN, McCurdy MW, Zorman CA, Reed RA, Schrimpf RD, Alles ML,&nbsp;<strong>Feng PXL<\/strong><sup>*<\/sup>, \u201cProbing Heavy Ion Radiation Effects in&nbsp;SiC&nbsp;via 3D Integrated Multimode Vibrating Diaphragms\u201d,&nbsp;<em>Applied Physics Letters<\/em>&nbsp;<strong>114<\/strong>, 101901 (2019).\u202f [\u201c<strong><em>Editor\u2019s Pick<\/em><\/strong>\u201d Article]. DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1063\/1.5063782\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1063\/1.5063782<\/a>\u202f&nbsp;<\/li>\n\n\n\n<li>Lee JS,&nbsp;Krupcale&nbsp;MJ,&nbsp;<strong>Feng PXL<\/strong><sup>*<\/sup>, \u201cEffect of g-Ray Radiation on 2D MoS<sub>2<\/sub>&nbsp;Nanomechanical Resonators\u201d,&nbsp;<em>Applied Physics Letters<\/em>&nbsp;<strong>108<\/strong>, 023106 (2016). DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1063\/1.4939685\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1063\/1.4939685<\/a>\u202f&nbsp;&nbsp;<\/li>\n\n\n\n<li>Sui W,&nbsp;Zheng XQ, Lin J-T,&nbsp;Lee J, Davidson JL, Reed RA, Schrimpf RD,&nbsp;Alphenaar&nbsp;BW, Alles ML,&nbsp;<strong>Feng PXL<\/strong><sup>*<\/sup>, \u201cEffects of Ion-Induced Displacement Damage on&nbsp;GaN\/AlN&nbsp;MEMS Resonators\u201d,&nbsp;<em>IEEE Transactions on Nuclear Science&nbsp;<\/em><strong>69<\/strong>, 521-529 (2022).\u202f DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1109\/TNS.2022.3143550\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1109\/TNS.2022.3143550<\/a>.\u202f&nbsp;&nbsp;<\/li>\n\n\n\n<li>Jia H,&nbsp;McCandless JP,&nbsp;Chen H, Liao W, Zhang EX, McCurdy M, Reed RA, Schrimpf RD, Alles ML,&nbsp;<strong>Feng PXL<\/strong><sup>*<\/sup>, \u201cProton Radiation Effects on Optically Transduced Silicon Carbide&nbsp;Microdisk&nbsp;Resonators\u201d,&nbsp;<em>Optical Materials Express<\/em>&nbsp;<strong>13<\/strong>(6), 1797-1807 (2023). DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1364\/OME.481425\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1364\/OME.481425<\/a>\u202f&nbsp;&nbsp;<\/li>\n\n\n\n<li>Yang R,&nbsp;Wang ZH,&nbsp;Lee JS,&nbsp;Ladhane&nbsp;K, Young DJ,&nbsp;<strong>Feng PXL<\/strong><sup>*<\/sup>, \u201c6H-SiC&nbsp;Microdisk&nbsp;Torsional Resonators in a \u2018Smart-Cut\u2019 Technology\u201d,&nbsp;<em>Applied Physics Letters<\/em>&nbsp;<strong>104<\/strong>, 091906 (2014). DOI:&nbsp;<a href=\"https:\/\/doi.org\/10.1063\/1.4867866\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.1063\/1.4867866<\/a>&nbsp;\u202f&nbsp;<\/li>\n<\/ul>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Overview Our lab has significantly advanced the understanding of radiation-material interactions in MEMS and NEMS. The lab has examined how gamma rays, protons, heavy ions, and ion-induced displacement damage&nbsp;affects&nbsp;the structural integrity and resonant performance of advanced materials and devices. Ion induced displacement damage and&nbsp;heavy ion&nbsp;irradiation have the potential to influence MEMS resonators\u2019 frequency stability, quality [&hellip;]<\/p>\n","protected":false},"author":1399,"featured_media":0,"parent":9,"menu_order":11,"comment_status":"closed","ping_status":"closed","template":"page-templates\/page-section-nav.php","meta":{"_acf_changed":false,"inline_featured_image":false,"featured_post":"","footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-2139","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/pages\/2139","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/users\/1399"}],"replies":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/comments?post=2139"}],"version-history":[{"count":7,"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/pages\/2139\/revisions"}],"predecessor-version":[{"id":3161,"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/pages\/2139\/revisions\/3161"}],"up":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/pages\/9"}],"wp:attachment":[{"href":"https:\/\/faculty.eng.ufl.edu\/quanta\/wp-json\/wp\/v2\/media?parent=2139"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}