{"id":822,"date":"2020-06-05T11:45:29","date_gmt":"2020-06-05T16:45:29","guid":{"rendered":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/?page_id=822"},"modified":"2026-02-12T15:33:08","modified_gmt":"2026-02-12T20:33:08","slug":"outreach","status":"publish","type":"page","link":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/outreach\/","title":{"rendered":"Outreach"},"content":{"rendered":"\n<p>Conferences:<\/p>\n\n\n\n<p><a href=\"https:\/\/paine-conference.org\/\">IEEE Physical Assurance and Inspection of Electronics Conference<\/a><\/p>\n\n\n\n<p>Supported by <strong data-start=\"116\" data-end=\"154\">IEEE Electronics Packaging Society<\/strong> and <strong data-start=\"159\" data-end=\"187\" data-is-last-node=\"\">IEEE Reliability Society<\/strong><\/p>\n\n\n\n<p>&nbsp;<\/p>\n\n\n\n<p>Outreach Strategy:<\/p>\n\n\n\n<figure class=\"wp-block-image size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"418\" src=\"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-content\/uploads\/sites\/769\/2020\/08\/Capture-1024x418.png\" alt=\"\" class=\"wp-image-932\" style=\"width:500px\" srcset=\"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-content\/uploads\/sites\/769\/2020\/08\/Capture-1024x418.png 1024w, https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-content\/uploads\/sites\/769\/2020\/08\/Capture-300x122.png 300w, https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-content\/uploads\/sites\/769\/2020\/08\/Capture-768x313.png 768w, https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-content\/uploads\/sites\/769\/2020\/08\/Capture-1536x626.png 1536w, https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-content\/uploads\/sites\/769\/2020\/08\/Capture.png 1780w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Conferences: IEEE Physical Assurance and Inspection of Electronics Conference Supported by IEEE Electronics Packaging Society and IEEE Reliability Society &nbsp; Outreach Strategy: &nbsp;<\/p>\n","protected":false},"author":468,"featured_media":0,"parent":0,"menu_order":7,"comment_status":"closed","ping_status":"closed","template":"page-templates\/page-section-nav.php","meta":{"_acf_changed":false,"inline_featured_image":false,"featured_post":"","footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-822","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/pages\/822","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/users\/468"}],"replies":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/comments?post=822"}],"version-history":[{"count":2,"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/pages\/822\/revisions"}],"predecessor-version":[{"id":1403,"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/pages\/822\/revisions\/1403"}],"wp:attachment":[{"href":"https:\/\/faculty.eng.ufl.edu\/navid-asadi\/wp-json\/wp\/v2\/media?parent=822"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}