{"id":11,"date":"2015-11-03T15:53:38","date_gmt":"2015-11-03T20:53:38","guid":{"rendered":"https:\/\/test.eng.ufl.edu\/faculty-site\/?page_id=11"},"modified":"2025-12-18T11:13:11","modified_gmt":"2025-12-18T16:13:11","slug":"publications","status":"publish","type":"page","link":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"<h3><a href=\"https:\/\/scholar.google.com\/citations?user=HABZNjAAAAAJ&amp;hl=en&amp;oi=ao\" target=\"_blank\" rel=\"noopener noreferrer\">Google Scholar\u00a0page<\/a><\/h3>\n<h3>ORCID ID: <a href=\"http:\/\/orcid.org\/0000-0001-6971-2063\" target=\"_blank\" rel=\"noopener noreferrer\">0000-0001-6971-2063<\/a><\/h3>\n<h3>ResearcherID: <a href=\"http:\/\/www.researcherid.com\/rid\/L-5252-2014\" target=\"_blank\" rel=\"noopener noreferrer\">L-5252-2014<\/a>\u00a0<\/h3>\n<p>&nbsp;<\/p>\n<h2>Journal Publications<\/h2>\n<ol>\n<li>J. Hicks, J. Li, C. Ying, and <strong>Ant Ural<\/strong>, &#8220;Effect of nanowire curviness on the percolation resistivity of transparent, conductive metal nanowire networks,&#8221; <em>Journal of Applied Physics<\/em> <strong>123<\/strong>, 204309 (2018). <a href=\"https:\/\/doi.org\/10.1063\/1.5029896\" target=\"_blank\" rel=\"noopener\">[link]<\/a>\u00a0 <a href=\"https:\/\/doi.org\/10.1063\/1.5042088\" target=\"_blank\" rel=\"noopener\"><strong>(highlighted in <em>AIP Scilight<\/em> and selected as a <em>Featured Article<\/em>)<\/strong><\/a>\u00a0<\/li>\n<li>Y. An, A. Shekhawat, A. Behnam, E. Pop, and <strong>Ant Ural<\/strong>, &#8220;Characterization of graphene gate electrodes for metal-oxide-semiconductor devices,&#8221; \u00a0<em>MRS Advances<\/em> <strong>2<\/strong>, 103 (2017).\u00a0<a href=\"https:\/\/doi.org\/10.1557\/adv.2017.65\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\">Y. An, A. Shekhawat, A. Behnam, E. Pop, and <strong>Ant Ural<\/strong>, &#8220;Gate tunneling current and quantum capacitance in metal-oxide-semiconductor devices with graphene gate electrodes,&#8221;\u00a0<em>Applied Physics Letters\u00a0<\/em><strong>109<\/strong>, 223104 (2016). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.4968824\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\">Y. An, A. Behnam, E. Pop, G. Bosman, and <strong>Ant Ural<\/strong>, <span class=\"dark-blue\">\u201c<\/span>Forward-bias diode parameters, electronic noise, and photoresponse of graphene\/silicon Schottky junctions with an interfacial native oxide layer,<span class=\"dark-blue\">\u201d <\/span><em><span class=\"dark-blue\">J<\/span>ournal of Applied Physics <\/em><strong>118<\/strong>, 114307 (2015).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.4931142\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\">Y. An, A. Behnam, E. Pop, and <strong>Ant Ural<\/strong>, \u201cMetal-semiconductor-metal photodetectors based on graphene\/<em>p<\/em>-type silicon Schottky junctions,\u201d <em>Applied Physics Letters<\/em> <strong>102<\/strong>, 013110 (2013).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.4773992\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\">V. A. Sydoruk, M. V. Petrychuk, <strong>Ant Ural<\/strong>, G. Bosman, A. Offenhausser, S. A. Vitusevich, \u201cNoise spectroscopy of transport properties in carbon nanotube field-effect transistors,\u201d <em>Carbon<\/em> <strong>53<\/strong>, 252 (2013).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1016\/j.carbon.2012.10.056\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. An, H. Rao, G. Bosman and <strong>Ant Ural<\/strong>, &#8220;Random telegraph signal and 1\/<em>f<\/em> noise in forward-biased single-walled carbon nanotube film-Silicon Schottky junctions,&#8221; <em>Applied Physics Letters<\/em> <strong>100<\/strong>, 213102 (2012).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.4719094\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. An, H. Rao, G. Bosman, and <strong>Ant Ural<\/strong>, \u201cCharacterization of carbon nanotube film-silicon Schottky barrier photodetectors,\u201d <em>Journal of Vacuum Science and Technology B<\/em> <strong>30<\/strong>, 021805 (2012).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1116\/1.3690645\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. Choi, M. Michan, J. L. Johnson, A. Naieni, <strong>Ant Ural<\/strong>, and A. Nojeh, &#8220;Field-emission properties of individual GaN nanowires grown by chemical vapor deposition,&#8221; <em>Journal of Applied Physics<\/em> <strong>111<\/strong>, 044308 (2012).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.3685903\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. Zhou, J. L. Johnson, <strong>Ant Ural<\/strong>, and H. Xie, &#8220;Localized growth of carbon nanotubes on CMOS substrate at room temperature using maskless post-CMOS processing,&#8221; <em>IEEE Transactions on Nanotechnology<\/em> <strong>11<\/strong>, 16 (2012).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1109\/TNANO.2009.2037757\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, A. Behnam, Y. An, S. J. Pearton, and <strong>Ant Ural<\/strong>, \u201cExperimental study of graphitic nanoribbon films for ammonia sensing,\u201d <em>Journal of Applied Physics <\/em><strong>109<\/strong>, 124301 (2011).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.3597635\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. L. Johnson, Y. An, A. Biswas, and <strong>Ant Ural<\/strong>, \u201cElectronic transport in graphitic nanoribbon films,\u201d <em>ACS<\/em><em> Nano<\/em> <strong>5<\/strong>, 1617 (2011).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1021\/nn100855n\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, N. Arkali Radhakrishna, Z. Wu, and <strong>Ant Ural<\/strong>, \u201cElectronic properties of metal-semiconductor and metal-oxide-semiconductor structures composed of carbon nanotube film on silicon,\u201d <em>Applied Physics Letters<\/em> <strong>97<\/strong>, 233105 (2010).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.3524194\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, A. Biswas, G. Bosman, and <strong>Ant Ural<\/strong>, \u201cTemperature-dependent transport and 1\/<em>f <\/em>noise mechanisms in single-walled carbon nanotube films,\u201d <em>Physical Review B<\/em> <strong>81<\/strong>, 125407 (2010).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevB.81.125407\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, A. Behnam, S. J. Pearton, and <strong>Ant Ural<\/strong>, &#8220;Hydrogen sensing using Pd-functionalized multi-layer graphene nanoribbon networks,&#8221; <em>Advanced Materials<\/em> <strong>22<\/strong>, 4877 (2010).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1002\/adma.201001798\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">V. K. Sangwan, A. Behnam, V. W. Ballarotto, M. S. Fuhrer, <strong>Ant Ural<\/strong>, and E. D. Williams, &#8220;Optimizing transistor performance of percolating carbon nanotube networks,&#8221; <em>Applied Physics Letters<\/em> <strong>97<\/strong>, 043111 (2010).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.3469930\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. S. Wright, W. Lim, D. P. Norton, S. J. Pearton, F. Ren, J. L. Johnson, and <strong>Ant Ural<\/strong>, \u201cNitride and oxide semiconductor nanostructured hydrogen gas sensors,\u201d <em>Semiconductor Science and Technology <\/em><strong>25<\/strong>, 024002 (2010).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1088\/0268-1242\/25\/2\/024002\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">S. A. Vitusevich, V. A. Sydoruk, M. V. Petrychuk, B. A. Danilchenko, N. Klein, A. Offenh\u00e4usser, <strong>Ant Ural<\/strong>, and G. Bosman, \u201cTransport properties of single-walled carbon nanotube transistors after gamma radiation treatment,\u201d <em>Journal of Applied Physics<\/em> <strong>107<\/strong>, 063701 (2010).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.3340977\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. Hicks, A. Behnam, and <strong>Ant Ural<\/strong>, \u201cA computational study of tunneling-percolation electrical transport in graphene-based nanocomposites,\u201d <em>Applied Physics Letters<\/em> <strong>95<\/strong>, 213103 (2009).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.3267079\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<a href=\"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-content\/uploads\/sites\/38\/2016\/06\/28_Hicks_APL_2009.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">]<\/a><\/li>\n<li style=\"text-align: justify\">J. Hicks, A. Behnam, and <strong>Ant Ural<\/strong>, \u201cResistivity in percolation networks of one dimensional elements with a length distribution,\u201d <em>Physical Review E<\/em> <strong>79<\/strong>, 012102 (2009).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevE.79.012102\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, \u201cElectronic properties of carbon nanotube percolation films and nanotube film-semiconductor junctions,\u201d <em>ECS Transactions<\/em> <strong>19<\/strong>, 43 (2009). <a href=\"https:\/\/doi.org\/10.1149\/1.3236793\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. L. Johnson, and <strong>Ant Ural<\/strong>, \u201cPatterned growth of silicon oxide nanowires from iron ion implanted SiO<sub>2<\/sub> substrates,\u201d <em>Nanotechnology<\/em> <strong>20<\/strong>, 135307 (2009). <strong><a href=\"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-content\/uploads\/sites\/38\/2016\/06\/26_Choi_Nanotechnology_2009_cover.pdf\" target=\"_blank\" rel=\"noopener noreferrer\">(cover feature)<\/a>\u00a0<\/strong><a href=\"http:\/\/dx.doi.org\/10.1088\/0957-4484\/20\/13\/135307\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. S. Wright, W. Lim, B. P. Gila, S. J. Pearton, J. L. Johnson, <strong>Ant Ural<\/strong>, and F. Ren, \u201cHydrogen sensing with Pt-functionalized GaN nanowires,\u201d <em>Sensors and Actuators B: Chemical<\/em> <strong>140<\/strong>, 196 (2009).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1016\/j.snb.2009.04.009\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, Y. Choi, <strong>Ant Ural<\/strong>, W. Lim, J. S. Wright, B. P. Gila, F. Ren, and S. J. Pearton, \u201cGrowth and characterization of GaN nanowires for hydrogen sensors,\u201d <em>Journal of Electronic Materials <\/em><strong>38<\/strong>, 490 (2009).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1007\/s11664-008-0596-z\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, G. Bosman, and <strong>Ant Ural<\/strong>, \u201cPercolation scaling of 1\/<em>f<\/em> noise in single-walled carbon nanotube films,\u201d <em>Physical Review B<\/em> <strong>78, <\/strong>085431 (2008).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevB.78.085431\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. L. Johnson, Y. Choi, M. G. Ertosun, A. K. Okyay, P. Kapur, K. C. Saraswat, and <strong>Ant Ural<\/strong>, \u201cExperimental characterization of single-walled carbon nanotube film-Si Schottky contacts using metal-semiconductor-metal structures,\u201d <em>Applied Physics Letters<\/em> <strong>92<\/strong>, 243116 (2008).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.2945644\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">W. Lim, J. S. Wright, B. P. Gila, J. L. Johnson, <strong>Ant Ural<\/strong>, T. Anderson, F. Ren, and S. J. Pearton, \u201cRoom temperature hydrogen detection using Pd-coated GaN nanowires,\u201d <em>Applied Physics Letters<\/em> <strong>93<\/strong>, 072109 (2008).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.2975173\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. Johnson, Y. Choi, L. Noriega, M. G. Ertosun, Z. Wu, A. G. Rinzler, P. Kapur, K. C. Saraswat, and <strong>Ant Ural<\/strong>, \u201cMetal-semiconductor-metal photodetectors based on single-walled carbon nanotube film\u2013GaAs Schottky contacts,\u201d <em>Journal of Applied Physics<\/em><strong> 103<\/strong>, 114315 (2008).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.2938037\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, Y. Choi, and <strong>Ant Ural<\/strong>, \u201cGaN nanowire and Ga<sub>2<\/sub>O<sub>3<\/sub> nanowire and nanoribbon growth from ion implanted iron catalyst,\u201d <em>Journal of Vacuum Science and Technology B <\/em><strong>26<\/strong>, 1841 (2008).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1116\/1.2993175\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. Guo, and <strong>Ant Ural, <\/strong>\u201cEffects of nanotube alignment and measurement direction on percolation resistivity in single-walled carbon nanotube films,\u201d <em>Journal of Applied Physics<\/em> <strong>102<\/strong>, 044313 (2007).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1063\/1.2769953\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam and <strong>Ant Ural<\/strong>, \u201cComputational study of geometry-dependent resistivity scaling in single-walled carbon nanotube films,\u201d <em>Physical Review B<\/em> <strong>75, <\/strong>125432 (2007).\u00a0<a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevB.75.125432\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, Y. Choi, L. Noriega, Z. Wu, I. Kravchenko, A. G. Rinzler, and <strong>Ant Ural<\/strong>, \u201cNanolithographic patterning of transparent, conductive single-walled carbon nanotube films by inductively coupled plasma reactive ion etching,<strong>\u201d <\/strong><em>Journal of Vacuum Science and Technology B<\/em> <strong>25<\/strong>, 348 (2007). <a href=\"http:\/\/dx.doi.org\/10.1116\/1.2699836\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\">Y. Choi, J. Sippel-Oakley, and <strong>Ant Ural<\/strong>, \u201cSingle-walled carbon nanotube growth from ion implanted Fe catalyst,\u201d <em>Applied Physics Letters<\/em> <strong>89<\/strong>, 153130 (2006). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.2360889\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. Johnson, R. Moreau, E. Perozziello, and <strong>Ant Ural<\/strong>, \u201cMicromachined silicon transmission electron microscopy grids for direct characterization of as-grown nanotubes,\u201d <em>Nanotechnology<\/em> <strong>17<\/strong>, 4635 (2006). <a href=\"http:\/\/dx.doi.org\/10.1088\/0957-4484\/17\/18\/017\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Behnam, L. Noriega, Y. Choi, Z. Wu, A. G. Rinzler, and <strong>Ant Ural<\/strong>, \u201cResistivity scaling in single-walled carbon nanotube films patterned to submicron dimensions,\u201d <em>Applied Physics Letters<\/em> <strong>89<\/strong>, 093107 (2006). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.2339029\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Nojeh, <strong>Ant Ural<\/strong>, R. F. Pease, and H. Dai, &#8220;Electric-field-directed growth of carbon nanotubes in two dimensions,&#8221; <em>Journal of Vacuum Science &amp; Technology B <\/em><strong>22<\/strong>, 3421 (2004). <a href=\"http:\/\/dx.doi.org\/10.1116\/1.1821578\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">Y. Li, D. Mann, M. Rolandi, W. Kim, <strong>Ant Ural<\/strong>, S. Hung, A. Javey, J. Cao, D. Wang, E. Yenilmez, Q. Wang, J. F. Gibbons, Y. Nishi, and H. Dai, \u201cPreferential growth of semiconducting single-walled carbon nanotubes by a plasma enhanced CVD method,\u201d <em>Nano Letters<\/em> <strong>4<\/strong>, 317 (2004). <a href=\"http:\/\/dx.doi.org\/10.1021\/nl035097c\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, Y. Li, and H. Dai, \u201cElectric-field-aligned growth of single-walled carbon nanotubes on surfaces,\u201d <em>Applied Physics Letters<\/em> <strong>81<\/strong>, 3464 (2002). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.1518773\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Javey, H. Kim, M. Brink, Q. Wang, <strong>Ant Ural<\/strong>, J. Guo, P. McIntyre, P. McEuen, M. Lundstrom, and H. Dai, \u201cHigh k dielectrics for advanced carbon nanotube transistors and logic,\u201d <em>Nature Materials<\/em> <strong>1<\/strong>, 241 (2002). <a href=\"http:\/\/dx.doi.org\/10.1038\/nmat769\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\">A. Javey, Q. Wang, <strong>Ant Ural<\/strong>, Y. Li, and H. Dai, \u201cCarbon nanotube transistor arrays for multistage complementary logic and ring oscillators,\u201d <em>Nano Letters<\/em> <strong>2<\/strong>, 929 (2002). <a href=\"http:\/\/dx.doi.org\/10.1021\/nl025647r\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cAtomic-scale diffusion mechanisms via interme\u00addiate species,\u201d <em>Physical Review B<\/em> <strong>65<\/strong>, 134303 (2002). <a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevB.65.134303\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cSilicon self-diffusion under extrinsic conditions,\u201d <em>Applied Physics Letters<\/em> <strong>79<\/strong>, 4328 (2001). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.1425953\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cUral, Griffin, and Plummer reply,\u201d <em>Physical Review Letters<\/em> <strong>85<\/strong>, 4836 (2000). <a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevLett.85.4836\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cSelf-diffusion in silicon: Similarity between the properties of native point defects,\u201d <em>Physical Review Letters<\/em> <strong>83<\/strong>, 3454 (1999). <a href=\"http:\/\/dx.doi.org\/10.1103\/PhysRevLett.83.3454\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cFractional contributions of microscopic diffusion mechanisms for common dopants and self-diffusion in silicon,\u201d <em>Journal of Applied Physics<\/em> <strong>85<\/strong>, 6440 (1999). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.370285\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cNonequilibrium experiments on self-diffusion in silicon at low temperatures using isotopically enriched structures,\u201d <em>Physica B<\/em> <strong>273<\/strong>, 512 (1999). <a href=\"http:\/\/dx.doi.org\/10.1016\/S0921-4526(99)00541-4\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a>\u00a0<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cExperimental evidence for a dual vacancy-inter\u00adstitial mechanism of self-diffusion in silicon,\u201d <em>Applied Physics Letters<\/em> <strong>73<\/strong>, 1706 (1998). <a href=\"http:\/\/dx.doi.org\/10.1063\/1.122252\" target=\"_blank\" rel=\"noopener noreferrer\">[link]<\/a><\/li>\n<\/ol>\n<h2>Conference Publications<\/h2>\n<ol>\n<li>J. Li, J. Hicks, T.-Y. Tsai, S. Mishra, and <strong>Ant Ural<\/strong>, \u201cRole of wire-to-wire junction resistance in percolation resistivity of transparent, conductive metal nanowire networks,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting<\/em>, Boston, MA, USA (2018).<\/li>\n<li>S. Mishra, J. Li, T.-Y. Tsai, J. Hicks, and <strong>Ant Ural<\/strong>, \u201cMonte Carlo simulation of percolation transport in transparent, conductive metal nanowire networks,\u201d presented at <em>NanoFlorida 2018<\/em>, Melbourne, FL, USA (2018).<\/li>\n<li><strong>Ant Ural<\/strong>, \u201cGraphene\/Insulator\/Silicon MOS capacitors: Fowler-Nordheim tunneling and quantum capacitance,\u201d presented at <em>Graphene 2018<\/em>, Dresden, Germany (2018).<\/li>\n<li>J. Li, C. Ying, J. Hicks, and <strong>Ant Ural<\/strong>, \u201cEffect of nanowire curviness on the resistivity scaling in one-dimensional metal nanowire networks for transparent conductors,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting<\/em>, Boston, MA, USA (2017).<\/li>\n<li>R. Lian, Y. An, and <strong>Ant Ural<\/strong>, \u201cEffect of graphene quantum capacitance in the presence of charged impurities on the <em>C<\/em>&#8211;<em>V<\/em> characteristics of graphene gate MOS devices,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting<\/em>, Boston, MA, USA (2017).<\/li>\n<li>J. Li, C. Ying, J. Hicks, and <strong>Ant Ural<\/strong>, \u201cPercolation resistivity in nanostructured transparent conductor networks consisting of curvy nanowires,\u201d presented at the <em>AVS 64<sup>th<\/sup> Symposium and Exhibition<\/em>, Tampa, FL, USA (2017)<em>.<\/em><\/li>\n<li>R. Lian and <strong>Ant Ural<\/strong>, \u201cCapacitance-voltage characteristics of graphene-gate MOS devices: The effect of graphene quantum capacitance,\u201d presented at the <em>AVS 64<sup>th<\/sup> Symposium and Exhibition<\/em>, Tampa, FL, USA (2017).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, \u201cGraphene\/Silicon mixed-dimensional van der Waals junctions,\u201d presented at <em>NanoFlorida 2017<\/em>, Miami, FL, USA (2017). <strong>(keynote talk)<\/strong>.<\/li>\n<li style=\"text-align: justify\">Y. An, A. Shekhawat, A. Behnam, E. Pop, and <strong>Ant Ural<\/strong>, &#8220;Metal-oxide-semiconductor (MOS) devices with graphene gate electrodes,&#8221; presented at\u00a0the <em>Materials Research Society (MRS) Fall\u00a0Meeting<\/em>, Boston, CA, USA (2016).<\/li>\n<li style=\"text-align: justify\">Y. An, A. Shekhawat, A. Behnam, E. Pop, and <strong>Ant Ural<\/strong>, \u201cMetal-oxide-semiconductor capacitors based on graphene and <em>p<\/em>-type silicon,\u201d presented at <em>NanoFlorida 2016<\/em>, Orlando, FL, USA (2016).<\/li>\n<li style=\"text-align: justify\">Y. An, A. Behnam, G. Bosman, E. Pop, and <strong>Ant Ural<\/strong>, \u201cFabrication and characterization of photodetectors composed of graphene\/silicon Schottky junctions,\u201d presented at the <em>225<sup>th<\/sup> Electrochemical Society (ECS) Meeting<\/em>, Orlando, FL, USA (2014).<\/li>\n<li style=\"text-align: justify\">Y. An, A. Behnam, E. Pop, and <strong>Ant Ural<\/strong>, \u201cGraphene\/p-type silicon metal-semiconductor-metal photodetectors,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (2013).<\/li>\n<li style=\"text-align: justify\">Y. An, H. Rao, G. Bosman, and <strong>Ant Ural<\/strong>, \u201cElectronic noise in carbon nanotube film-silicon Schottky junction devices,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (2012).<\/li>\n<li style=\"text-align: justify\">V. Sydoruk, M. Petrychuk, <strong>Ant Ural<\/strong>, G. Bosman, A. Offenh\u00e4usser, and S. A. Vitusevich, \u201cTransition from Schottky barrier determined to low-noise channel transport regime in carbon nanotube field effect transistors,\u201d presented at the <em>31st International Conference on the Physics of Semiconductors (ICPS 2012)<\/em>, Zurich, Switzerland (2012).<\/li>\n<li style=\"text-align: justify\">Y. An, J. L. Johnson, A. Behnam, S. J. Pearton, and <strong>Ant Ural<\/strong>, \u201cSensing gas molecules using graphitic nanoribbon films and networks,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em>, Dallas, TX, USA (2011).<\/li>\n<li style=\"text-align: justify\">V. A. Sydoruk, M. V. Petrychuk, A. Offenh\u00e4usser, <strong>Ant Ural<\/strong>, G. Bosman, and S. A. Vitusevich, \u201cNoise characterization of transport properties in single carbon nanotube field-effect transistors,\u201d presented at the <em>21st International Conference on Noise and Fluctuations (ICNF 2011)<\/em>, Toronto, Canada (2011).<\/li>\n<li style=\"text-align: justify\">A. Behnam, N. Arkali Radhakrishna, and <strong>Ant Ural<\/strong>, \u201cCharacterization of the metal-semiconductor and metal-insulator-semiconductor junctions between single-walled carbon nanotube films and Si substrates,\u201d presented at the <em>2010 Device Research Conference (DRC)<\/em>, South Bend, IN, USA (2010); <em>2010 Device Research Conference (DRC) Digest<\/em>, 141 (2010).<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. L. Johnson, Y. An, A. Biswas, and <strong>Ant Ural<\/strong>, \u201cLow temperature transport in networks based on multi-layer graphene nanoribbons,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em>, Portland, OR, USA (2010).<\/li>\n<li style=\"text-align: justify\">N. Arkali Radhakrishna, A. Behnam, J. L. Johnson, and <strong>Ant Ural<\/strong>, \u201cCharacterization of the junction between single-walled carbon nanotube films and silicon substrates,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em>, Portland, OR, USA (2010).<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. L. Johnson, Y. An, A. Biswas, and <strong>Ant Ural<\/strong>, \u201cNetworks based on graphene nanoribbons: Structure and electronic transport,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (2010).<\/li>\n<li style=\"text-align: justify\">N. Arkali Radhakrishna, A. Behnam, J. L. Johnson, and <strong>Ant Ural<\/strong>, \u201cSingle-walled carbon nanotube film-silicon junctions,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (2010).<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, A. Behnam, and <strong>Ant Ural<\/strong>, \u201cElectrical and materials characterization of large area, transparent, conductive graphene film networks and their potential for gas sensing,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting 2009<\/em>, Boston, MA, USA (2009).<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. M. Michan, J. L. Johnson, A. K. Naeini, <strong>Ant Ural<\/strong>, and A. Nojeh, \u201cField-emission properties of individual GaN nanowires grown by the vapour-liquid-solid method,\u201d presented at the <em>14<sup>th<\/sup> Annual Meeting of the <\/em><em>Pacific Centre for Advanced Materials and Microstructures<\/em><em> (PCAMM)<\/em>, Burnaby, British Columbia, Canada (2009).<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, A. Behnam, J. S. Wright, S. J. Pearton, and <strong>Ant Ural<\/strong>, \u201cLarge area, transparent, conductive graphene nanoribbon network gas sensors,\u201d presented at the <em>Nanoelectronic Devices for Defense and Security Conference (NANO-DDS 2009)<\/em>, Fort Lauderdale, FL, USA (2009).<\/li>\n<li style=\"text-align: justify\">N. Arkali Radhakrishna, A. Behnam, J. L. Johnson, and <strong>Ant Ural<\/strong>, \u201cElectrical characterization of the nanoscale interface between single-walled carbon nanotube films and silicon substrates,\u201d presented at the <em>Nanoelectronic Devices for Defense and Security Conference (NANO-DDS 2009)<\/em>, Fort Lauderdale, FL, USA (2009).<\/li>\n<li style=\"text-align: justify\">Y. Zhou, J. Johnson, <strong>Ant Ural<\/strong>, and H. Xie &#8220;Carbon nanotube-CMOS integration based on a maskless post-CMOS process,\u201d presented at the <em>Nanoelectronic Devices for Defense and Security Conference (NANO-DDS 2009)<\/em>, Fort Lauderdale, FL, USA (2009).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, \u201cElectronic properties of carbon nanotube films and nanotube film-semiconductor junctions,\u201d presented at the <em>215<sup>th<\/sup> Electrochemical Society (ECS) Meeting<\/em>, San Francisco, CA, USA (2009). <strong>(invited talk)<\/strong>; <em>Electrochemical Society (ECS) Transactions<\/em> <strong>19<\/strong>, 43 (2009).<\/li>\n<li style=\"text-align: justify\">A. Behnam, G. Bosman, and <strong>Ant Ural<\/strong>, \u201cCharacterization and modeling of low frequency noise in single-walled carbon nanotube film-based devices,\u201d presented at the <em>2009 Device Research Conference (DRC)<\/em>, University Park, PA, USA (2009); <em>2009 Device Research Conference (DRC) Digest<\/em>, 25 (2009).<\/li>\n<li style=\"text-align: justify\">A. Behnam, G. Bosman, and <strong>Ant Ural<\/strong>, \u201c1\/<em>f<\/em> noise in single-walled carbon nanotube films,\u201d presented at <em>SPIE<\/em> <em>Photonics West 2009<\/em>, San Jose, CA, USA (2009); <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering <\/em><strong>7204<\/strong>, 72040J (2009).<\/li>\n<li style=\"text-align: justify\">A. Behnam, <strong>Ant Ural<\/strong>, and G. Bosman, \u201cModeling and measurements of low frequency noise in single-walled carbon nanotube films with bulk and percolation configurations,\u201d presented at the <em>20th International Conference on Noise and Fluctuations (ICNF 2009)<\/em>, Pisa, Italy (2009). <strong>(invited talk)<\/strong>; <em>AIP Conference Proceedings<\/em> <strong>1129<\/strong>, 79 (2009).<\/li>\n<li style=\"text-align: justify\">E. Cicek, J. L. Johnson, <strong>Ant Ural<\/strong>, and G. Bosman, \u201cDefect noise spectroscopy results for GaN nanowires,\u201d presented at the <em>20th International Conference on Noise and Fluctuations (ICNF 2009)<\/em>, Pisa, Italy (2009); <em>AIP Conference Proceedings<\/em> <strong>1129<\/strong>, 101 (2009).<\/li>\n<li style=\"text-align: justify\">J. L. Johnson, Y. Choi, and <strong>Ant Ural<\/strong>, \u201cIon implanted SiO<sub>2<\/sub> substrates for nucleating silicon oxide nanowire growth,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting 2009, <\/em>San Francisco, CA, USA (2009); <em>Materials Research Society Symposium Proceedings<\/em> <strong>1181<\/strong>, 1181-DD07-03 (2009).<\/li>\n<li style=\"text-align: justify\">J. Hicks, A. Behnam, and <strong>Ant Ural<\/strong>, \u201cA computational study of electrical transport in graphene-based films and composites,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em> <em>2009<\/em>, Pittsburgh, PA, USA (2009).<\/li>\n<li style=\"text-align: justify\">A. Behnam, G. Bosman, and <strong>Ant Ural<\/strong>, \u201cExperimental and computational study of 1\/<em>f<\/em> noise scaling in single-walled carbon nanotube percolation films,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em> <em>2009<\/em>, Pittsburgh, PA, USA (2009).<\/li>\n<li style=\"text-align: justify\">W. Lim, J. Wright, B. P. Gila, J. L. Johnson, <strong>Ant Ural<\/strong>, T. Anderson, F. Ren, and S. J. Pearton, \u201cRoom temperature hydrogen detection using Pd-coated GaN nanowires,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting<\/em>, Boston, MA, USA (2008).<\/li>\n<li style=\"text-align: justify\">Y. Zhou, J. Johnson, L. Wu, S. Maley, <strong>Ant Ural<\/strong>, and H. Xie, \u201cDesign and fabrication of microheaters for localized carbon nanotube growth,\u201d presented at the <em>8th International Conference on Nanotechnology (IEEE Nano 2008)<\/em>, Arlington, TX, USA (2008); <em>Proceedings of the 8th IEEE Conference on Nanotechnology (NANO)<\/em>, 452 (2008).<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. L. Johnson, and <strong>Ant Ural<\/strong>, \u201cGaN and Ga<sub>2<\/sub>O<sub>3<\/sub> nanowire and nanoribbon growth from ion implanted Fe catalyst,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (2008).<\/li>\n<li style=\"text-align: justify\">A. Behnam<u>,<\/u> J. L. Johnson, Y. Choi, L. Noriega, M. G. Ertosun, Z. Wu, A. G. Rinzler, P. Kapur, K. C. Saraswat, and <strong>Ant Ural<\/strong>, \u201cMetal-Semiconductor-Metal (MSM) photodetectors with single-walled carbon nanotube film Schottky electrodes on GaAs,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em>, New Orleans, LA, USA (2008).<\/li>\n<li style=\"text-align: justify\">J. Hicks, A. Behnam, and <strong>Ant Ural<\/strong>, \u201cMonte Carlo simulations of the effect of nanotube length distribution on the percolation resistivity in single-walled carbon nanotube films,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em>, New Orleans, LA, USA (2008).<\/li>\n<li style=\"text-align: justify\">A. Behnam, J. L. Johnson, Y. Choi, M. G. Ertosun, Z. Wu, A. G. Rinzler, P. Kapur, K. C. Saraswat, and <strong>Ant Ural<\/strong>, \u201cMetal-Semiconductor-Metal (MSM) photodetectors based on single-walled carbon nanotube film-Silicon Schottky contacts,\u201d presented at <em>SPIE<\/em> <em>Photonics West 2008<\/em>, San Jose, CA, USA (2008); <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering <\/em> <strong>6885<\/strong>, 68850A\u00a0(2008).<\/li>\n<li style=\"text-align: justify\">J. Johnson, A. Behnam, Y. Choi, L. Noriega, G. Ertosun, Z. Wu, A. G. Rinzler, P. Kapur, K. C. Saraswat, and <strong>Ant Ural<\/strong>, &#8220;Metal-Semiconductor-Metal (MSM) photodetectors based on single-walled carbon nanotube film-GaAs Schottky contacts,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting<\/em>, Boston, MA, USA (2007); <em>Materials Research Society Symposium Proceedings<\/em> <strong>1057<\/strong>, 1057-II22-05 (2007).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, A. Behnam, J. Johnson, and Y. Choi, \u201cPercolation transport in single-walled carbon nanotube films: Experiment and Simulation,\u201d presented at <em>SPIE Optics East 2007<\/em>, Boston, MA, USA (2007). <strong>(invited talk)<\/strong>; <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering <\/em><strong>6769<\/strong>, 67690B\u00a0(2007).<\/li>\n<li style=\"text-align: justify\">A. Behnam and <strong>Ant Ural<\/strong>, \u201cElectrical characterization and modeling of geometry-dependent resistivity scaling in single-walled carbon nanotube films,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting, <\/em>San Francisco, CA, USA (2007).<\/li>\n<li style=\"text-align: justify\">A. Behnam and <strong>Ant Ural<\/strong>, \u201cGeometry-dependent resistivity scaling in single-walled carbon nanotube films,\u201d presented at the <em>American Physical Society (APS) March Meeting<\/em>, Denver, CO, USA (2007).<\/li>\n<li style=\"text-align: justify\">Y. Choi and <strong>Ant Ural<\/strong>, \u201cMicromachined silicon grids for direct TEM and Raman characterization of CVD grown carbon nanotubes,\u201d presented at <em>SPIE<\/em> <em>Photonics West 2007<\/em>, San Jose, CA, USA (2007); <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering <\/em><strong>6464<\/strong>, 64640A\u00a0(2007).<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. Johnson, R. Moreau, E. Perozziello, and <strong>Ant Ural<\/strong>, \u201cMicromachined silicon grids for direct TEM characterization of carbon nanotubes grown by CVD,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting, <\/em>Boston, MA, USA (2006); <em>Materials Research Society Symposium Proceedings<\/em> <strong>963<\/strong>, 0963-Q20-13 (2006).<\/li>\n<li style=\"text-align: justify\">A. Behnam, L. Noriega, Y. Choi, Z. Wu, A. G. Rinzler, and <strong>Ant Ural<\/strong>, \u201cGeometry dependent resistivity in single-walled carbon nanotube films patterned down to submicron dimensions,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting, <\/em>Boston, MA, USA (2006); <em>Materials Research Society Symposium Proceedings<\/em> <strong>963<\/strong>, 0963-Q10-55 (2006).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, \u201cElectrical properties of single-walled nanotube films,\u201d presented at <em>SPIE Optics East 2006<\/em>, Boston, MA, USA (2006). <strong>(invited talk)<\/strong>; <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering <\/em><strong>6370<\/strong>, 63700F (2006).<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. Sippel-Oakley, A. G. Rinzler, and <strong>Ant Ural, \u201c<\/strong>Carbon nanotube growth from nanoscale clusters formed by ion implantation,\u201d presented at the <em>Materials Research Society (MRS) Fall Meeting, <\/em>Boston, MA, USA (2005); <em>Materials Research Society Symposium Proceedings<\/em> <strong>908<\/strong>, 0908-OO15-03 (2005).<\/li>\n<li style=\"text-align: justify\">Y. Choi, J. Sippel-Oakley, A. G. Rinzler, and <strong>Ant Ural, \u201c<\/strong>Carbon nanotube growth from ion-implanted catalyst by chemical vapor deposition,\u201d presented at <em>SPIE Optics East 2005<\/em>, Boston, MA, USA (2005); <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering<\/em><strong> 6008<\/strong>, 600805 (2005).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, \u201cElectric field assisted growth and assembly of carbon nanotubes for nanoelectronics and nanosensing applications,\u201d presented at <em>SPIE Optics East 2004<\/em>, Philadelphia, PA, USA (2004). <strong>(invited talk)<\/strong>; <em>Proceedings of the SPIE \u2013 The International Society for Optical Engineering<\/em><strong> 5593<\/strong>, 28 (2004).<\/li>\n<li style=\"text-align: justify\">A. Nojeh, <strong>Ant Ural<\/strong>, R. F. Pease, and H. Dai, &#8220;Electric-field-directed growth of carbon nanotubes in two dimensions,&#8221; presented at the <em>48th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication<\/em> <em>(EIPBN 2004)<\/em>, San Diego, CA, USA (2004).<\/li>\n<li style=\"text-align: justify\">A. Javey, H. Kim, M. Brink, Q. Wang, <strong>Ant Ural<\/strong>, J. Guo, P. McIntyre, P. McEuen, M. Lundstrom, and H. Dai, &#8220;High k dielectrics for advanced carbon nanotube transistors and logic,&#8221; presented at the <em>American Physical Society (APS) March Meeting<\/em>, Austin, TX, USA (2003).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, S. Koh, P. B. Griffin, and J. D. Plummer, \u201cCoupled diffusion of dopants,\u201d presented at <em>TECHCON 2000<\/em>, Phoenix, AZ, USA (2000).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, S. Koh, P. B. Griffin, and J. D. Plummer, \u201cWhat does self-diffusion tell us about ultra shallow junctions?\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (2000); <em>Materials Research Society Symposium Proceedings<\/em> <strong>610<\/strong>, B4.11 (2000).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cNonequilibrium experiments on self-diffusion in silicon at low temperatures using isotopically enriched structures,\u201d presented at the <em>20th International Conference on Defects in Semiconductors (ICDS- 20)<\/em>, Berkeley, CA, USA (1999).<\/li>\n<li style=\"text-align: justify\"><strong>Ant Ural<\/strong>, P. B. Griffin, and J. D. Plummer, \u201cExperimental study of self-diffusion in silicon using isotopically enriched structures,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (1999); <em>Materials Research Society Symposium Proceedings<\/em> <strong>568<\/strong>, 97 (1999).<\/li>\n<li style=\"text-align: justify\">P. B. Griffin and <strong>Ant Ural<\/strong>, \u201cInteractions between silicon self-diffusion and dopant diffusion,\u201d presented at the <em>195<sup>th<\/sup> Electrochemical Society (ECS) Meeting<\/em>, Seattle, WA, USA (1999). <strong>(invited talk)<\/strong><\/li>\n<li style=\"text-align: justify\">S. K. Theiss, M.-J. Caturla, T. Diaz de la Rubia, M. C. Johnson, <strong>Ant Ural<\/strong>, and P. B. Griffin, \u201cLinking <em>ab initio<\/em> energetics to experiment: Kinetic Monte Carlo simulation of transient enhanced diffu\u00adsion of B in Si,\u201d presented at the <em>Materials Research Society (MRS) Spring Meeting<\/em>, San Francisco, CA, USA (1998); <em>Materials Research Society Symposium Proceedings<\/em> <strong>538<\/strong>, 291 (1998).<\/li>\n<\/ol>\n<h2 style=\"text-align: justify\">Book Chapters<\/h2>\n<ol>\n<li style=\"text-align: justify\">H. Xie, Y. Zhou, J. Johnson, and <strong>Ant Ural<\/strong>, \u201cMonolithic integration of carbon nanotubes and CMOS,\u201d in <em>Graphene, Carbon Nanotubes, and Nanostructures: Techniques and Applications<\/em>, edited by J. E. Morris and K. Iniewski, CRC Press (2016), p. 131-163.<\/li>\n<\/ol>\n<h2>Patents<\/h2>\n<ol>\n<li>H. Xie and <strong>Ant Ural<\/strong>, \u201cRoom temperature carbon nanotubes integrated on CMOS,\u201d US Patent\u00a08618611 (2013).<\/li>\n<\/ol>\n<h2>\u00a0<\/h2>\n<h2>\u00a0<\/h2>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Google Scholar\u00a0page ORCID ID: 0000-0001-6971-2063 ResearcherID: L-5252-2014\u00a0 &nbsp; Journal Publications J. Hicks, J. Li, C. Ying, and Ant Ural, &#8220;Effect of nanowire curviness on the percolation resistivity of transparent, conductive metal nanowire networks,&#8221; Journal of Applied Physics 123, 204309 (2018). [link]\u00a0 (highlighted in AIP Scilight and selected as a Featured Article)\u00a0 Y. An, A. Shekhawat, [&hellip;]<\/p>\n","protected":false},"author":72,"featured_media":0,"parent":0,"menu_order":3,"comment_status":"closed","ping_status":"closed","template":"page-templates\/page-sidebar-none.php","meta":{"_acf_changed":false,"inline_featured_image":false,"featured_post":"","footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-11","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/pages\/11","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/users\/72"}],"replies":[{"embeddable":true,"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/comments?post=11"}],"version-history":[{"count":20,"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/pages\/11\/revisions"}],"predecessor-version":[{"id":896,"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/pages\/11\/revisions\/896"}],"wp:attachment":[{"href":"https:\/\/faculty.eng.ufl.edu\/ant-ural\/wp-json\/wp\/v2\/media?parent=11"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}